2023年9月8日 更新
[ English page is here. ]
[1] “
Optical study of bis(propylenedithio)tetrathiafulvalenium (BPDT-TTF) salts
”,
K. Yakushi, H. Tajima, T. Ida, M. Tamura, H. Hayashi, H. Kuroda, and A. Kobayashi,
Synthetic Metals, 24(4), 301–309 (June 1988).
[2] “
Pressure dependence of the polarized reflectance spectrum of the solid charge-transfer complex, perylene-TCNQ: Estimation of microscopic parameters
”,
T. Ida, K. Yakushi, and H. Kuroda,
J. Chem. Phys. 91(6), 3450–3455 (September 1989).
[3] “
Polarized reflectance spectra of DCNQI salts
”,
K. Yakushi, A. Ugawa, G. Ojima, T. Ida, H. Tajima, H. Kuroda, A. Kobayashi, R. Kato, and H. Kobayashi,
Mol. Cryst. Liq. Cryst., 181, 217–231 (April 1990).
[4] “
High-pressure optical study of partially oxidized metallophthalocyanines and metallotetrabenzoporphyrins
”,
T. Ida, H. Yamakado, H. Masuda, K. Yakushi, D. Kanazawa, H. Tajima, and H. Kuroda,
Mol. Cryst. Liq. Cryst., 181, 243–252 (April 1990).
[5] “
d-π Interaction in conducting phthalocyaninatocobalt hexafluoroarsenate, CoPc(AsF6)0.5
”,
K. Yakushi, H. Yamakado, T. Ida, and A. Ugawa,
Solid State Commun., 78(10), 919–923 (June 1991).
[6] “
Pressure dependence of the polarized reflectance spectrum of a solid charge-transfer complex, perylene-hexacyanobutadiene (HCBD)
”,
T. Ida, K. Yakushi, H. Kuroda, H. Yamochi, and G. Saito,
Chem. Phys., 156(1), 113–122 (September 1991).
[7] “
Polarized reflectance spectra of single crystals of the phthalocyanine radicals NiPc(AsF6)0.5, H2Pc(AsF6)0.67, and LiPc
”,
K. Yakushi, T. Ida, A. Ugawa, H. Yamakado, H. Ishii, and H. Kuroda,
J. Phys. Chem., 95(20), 7636–7641 (October 1991).
[8] “
Structure of the charge-transfer complex of (DBTTF)(BTDA-TCNQ)
”,
K. Iwasaki, T. Ida, A. Kawamoto, A. Ugawa, Y. Yamashita, K. Yakushi, and T. Suzuki,
Acta Cryst. C 48(11), 1982–1984 (November 1992).
[9] “
Measurement of magnetic susceptibility of magnesium ultrafine particles
”,
T. Ida and K. Kimura,
Z. Phys. D 26, S140–142 (March 1993).
[10] “
Structure and solid state properties of the conductive salt of (phthalocyaninato) cobalt, CoPc(AsF6)0.5
”,
K. Yakushi, H. Yamakado, T. Ida, A. Ugawa, K. Awaga, Y. Maruyama, K. Imaeda, and H. Inokuchi,
Synthetic Metals 56(1), 1699–1704 (March 1993).
[11] “
Structure and solid-state properties of the stable ring-oxidized conductor CoPc(AsF6)0.5: interaction between ring pi-electrons and cobalt d-electrons
”,
H. Yamakado, T. Ida, A. Ugawa, K. Yakushi, K. Awaga, Y. Maruyama, K. Imaeda, and H. Inokuchi,
Synthetic Metals 62(2), 169–178 (January 1994).
[12] “
The preparation and properties of polycrystals of solid electrolyte ultrafine particles
”,
T. Ida, H. Saeki, H. Hamada, and K. Kimura,
Surface Rev. Lett. 3(1), 41–44 (February 1996).
[13] “
Plasmon absorption of gold nanoparticles and their morphologies observed by AFM
”,
H. Ishikawa, T. Ida, and K. Kimura,
Surface Rev. Lett. 3(1), 1153–1156 (February 1996).
[14] “
Temperature effect on gold nanodispersion in organic liquids
”,
Y. Takeuchi, T. Ida, and K. Kimura,
Surface Rev. Lett. 3(1), 1205–1208 (February 1996).
[15] “
Electrocrystallization, crystal structure, and solid state properties of halogen-bridged one-dimensional compound, {[Ni(en)2Br](ClO4)2}∞, having an elongated Ni…Ni distance
”,
Y. Ozawa, T. Ikuno, S. Amano, T. Ida, A. Ibaraki, K. Kimura, and K. Toriumi,
Mol. Cryst. Liq. Cryst. 278, 189–197 (March 1996).
[16] “
Blue-green photoluminescence from ultrafine colloidal Si particles in 2-propanol
”,
S. Iwasaki, T. Ida, and K. Kimura,
Jpn. J. Appl. Phys. 35, L551–L554 (May 1996).
[17] “
Colloidal stability of gold nanoparticles in 2-propanol under laser irradiation
”,
Y. Takeuchi, T. Ida, and K. Kimura,
J. Phys. Chem. B 101(8), 1322–1327 (February 1997).
[18] “
A novel method for large-scale synthesis of AgInanoparticles
”,
S. Chen, T. Ida, and K. Kimura,
Chem. Commun., 1997(23), 2301–2302 (December 1997).
[19] “
Ionic conductivity of small-grain polycrystals of silver iodide
”,
T. Ida and K. Kimura,
Solid State Ionics, 107(3–4), 313–318 (April 1998).
[20] “
Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry
”,
T. Ida,
Rev. Sci. Instrum., 69(6), 2268–2272 (June, 1998).
[21] “
Thiol-derivatized AgI Nanoparticles: Synthesis, Characterization and Optical Properties
”,
S. Chen, T. Ida, and K. Kimura,
J. Phys. Chem. B 102(32), 6169–6176 (August 1998).
[22] “
An efficient method for calculating asymmetric diffraction peak profiles
”,
T. Ida,
Rev. Sci. Instrum., 69(11), 3837–3839 (November 1998).
[23] “
Flat-specimen effect as a convolution in powder diffractometry with Bragg-Brentano geometry
”,
T. Ida and K. Kimura,
J. Appl. Cryst., 32(4), 634–640 (August 1999).
[24] “
Effect of sample transparency in powder diffractometry with Bragg-Brentano geometry as a convolution
”,
T. Ida and K. Kimura,
J. Appl. Cryst., 32(5), 982–991 (October 1999).
[25] “
Extended pseudo-Voigt function for approximating the Voigt profile
”,
T. Ida, M. Ando and H. Toraya,
J. Appl. Cryst., 33(6), 1311–1316 (December 2000).
[reprint]
[26] “
Peak profile function for synchrotron X-ray diffractometry
”,
T. Ida, H. Hibino and H. Toraya,
J. Appl. Cryst., 34(2), 144–151 (April 2001).
[reprint]
[27] “
Ab initio structure determination of monoclinic 2,2-dihydroxymethylbutanoic acid from synchrotron radiation powder diffraction data: combined use of direct methods and the Monte Carlo method
”,
Y. Tanahashi, H. Nakamura, S. Yamazaki, Y. Kojima, H. Saito, T. Ida and H. Toraya,
Acta Cryst. B 57(2), 184–189 (April 2001).
[28] “
The Monte Carlo method for finding missing atoms in solving crystal structures from powder diffraction data without applying a rigid-body approximation
”,
H. Nakamura, S. Yamazaki, T. Ohnishi, T. Ida, and H. Toraya,
Powder Diffraction, 16(2), 65–70 (June 2001).
[29] “
粉末Ｘ線回折プロファイル関数の開発
”,
井田 隆，
日本結晶学会誌 43(3), 269–274 (June 2001).
[30] “
Standardless estimation of lattice constants based on fundamental parameters approach
”,
T. Ida and H. Toraya,
Materials Science Forum, 378/381, 86–91 (October 2001).
[31] “
Deconvolution of the instrumental functions in powder X-ray diffractometry
”,
T. Ida and H. Toraya,
J. Appl. Cryst., 35(1), 58–68 (February 2002).
[reprint]
[32] “
Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry
”,
T. Ida, H. Hibino and H. Toraya,
J. Appl. Cryst., 36(2), 181–187 (April 2003).
[reprint]
[33] “
Quantitative basis for the rocking-curve measurement of preferred orientation in polycrystalline thin films
”,
H. Toraya, H. Hibino, T. Ida and N. Kuwano,
J. Appl. Cryst., 36(3), 890–897 (June 2003).
[34] “
デコンボリューションによる粉末Ｘ線回折データからの装置収差の除去
”,
井田 隆，
日本結晶学会誌 45(4), 249–255 (August 2003).
[35] “
Diffraction peak profiles from spherical crystallites with lognormal size distribution
”,
T. Ida, S. Shimazaki, H. Hibino and H. Toraya,
J. Appl. Cryst., 36(5), 1107–1115 (October 2003).
[reprint]
[36] “
ラマン分光法による BaTiO3 ナノ粒子の誘電特性の評価
”,
大野智也，鈴木大輔，鈴木久男，井田 隆，
粉体工学会誌, 41(2), 4–9 (February 2004).
[37] “
Ionization potentials of transparent conductive indium tin oxide films covered with a single layer of fluorine-doped tin oxide nanoparticles grown by spray pyrolysis deposition
”,
T. Fukano, T. Motohiro, T. Ida and H. Hashizume,
J. Appl. Phys., 97, 084316 (9pages) (April 2005).
[38] “
Correction for counting losses in X-ray diffractometry
”,
T. Ida and Y. Iwata,
J. Appl. Cryst., 38(3), 426–432 (June 2005).
[reprint]
[39] “
Connection of segmented intensity data measured with a multiple-detector system for powder diffractometry
”,
T. Ida,
J. Appl. Cryst., 38(5), 795–803 (October 2005).
[reprint]
[40] “
A compact furnace for synchrotron powder diffraction measurements up to 1807 K
”,
M. Yashima, M. Tanaka, K. Oh-uchi and T. Ida,
J. Appl. Cryst. 38(5), 854–855 (October 2005).
[reprint]
[41] “
A non-centrosymmetric polymorph of Gd3RuO7
”,
N. Ishizawa, K. Hiraga, D. Boulay, H. Hibino, T. Ida and S. Oishi,
Acta Cryst. E 62, i13–i16 (January 2006).
[42] “
Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer
”,
T. Ida and H. Hibino,
J. Appl. Cryst. 39(1), 90–100 (February 2006).
[reprint]
[43] “
検出器多連装型高分解能軌道放射光粉末回折計により測定された回折データの解析法の開発
”,
井田 隆, 日比野寿,
名古屋工業大学セラミックス基盤工学研究センター年報, 5, 1–11 (April 2006).
[目次]
[44] “
A compact furnace for synchrotron powder diffraction experiments up to 1800 K
”,
M. Yashima, K. Oh-uchi, M. Tanaka and T. Ida,
J. Am. Ceram. Soc. 89[4], 1395–1399 (April 2006).
[45] “
The effect of oxygen pressure on the synthesis of LiNiO2
”,
B-H. Kim, J-H. Kim, M-Y. Song, T. Ida and N. Ishizawa,
Solid State Phenomena, 124–126 1043–1046 (December 2006).
[46] “
粉末回折ピーク形状の「尖り度」を特徴づける新しいパラメータ
”,
井田 隆,
名古屋工業大学セラミックス基盤工学研究センター年報, 6, 1–11 (April 2007).
[目次]
[47] “
Ｘ線回折法による結晶子サイズ分布解析 — ビス（アセチルアセトナト）亜鉛を出発物質とする ZnO ナノ単結晶を例に —
”,
小中 尚, 佐々木明登, 稲葉克彦, 井田 隆, 羽賀浩一, 宍戸統悦,
J. Flux Growth 2(1), 41–44 (June 2007).
[48] “
Monte Carlo Simulation of the Effect of Counting Losses on Measured X-ray Intensities
”,
T. Ida,
J. Appl. Cryst., 40(5), 964–965 (October 2007)
[reprint]
[49] “
検出器多連装型高分解能回折計を用いた放射光粉末回折測定の進展
”,
井田 隆,
日本結晶学会誌, 49(6), 347–353 (December 2007).
[abstract]
[50] “
検出システムの数え落しの影響を受けた観測強度データの統計的な性質
”,
井田 隆, 大矢哲久, 日比野 寿,
名古屋工業大学セラミックス基盤工学研究センター年報, 7, 1–15 (March 2008).
[目次]
[51] “
New measures of sharpness for symmetric powder diffraction peak profiles
”,
T. Ida,
J. Appl. Cryst. 41(2), 393–401 (April 2008).
[reprint]
[52] “
Statistical properties of measured X-ray intensities affected by counting loss
”,
T. Ida,
J. Appl. Cryst. 41(6), 1019–1023 (December 2008).
[reprint]
[53] “ Isolation of solid solution phases in size-controlled LixFePO4 at room Temperature ” G. Kobayashi, S. Nishimura, M. Park, R. Kanno, M. Yashima, T. Ida & A. Yamada, Adv. Funct. Mater. 18(3), 395–403 (February 2009).
[54] “
Evaluation of particle statistics in powder diffractometry by a spinner-scan method
”
T. Ida, T. Goto & H. Hibino,
J. Appl. Cryst. 42(4), 597–606 (August 2009).
[reprint]
[55] “
軌道放射光粉末回折測定における粒子統計の効果
”,
井田 隆, 後藤大士, 日比野寿,
名古屋工業大学セラミックス基盤工学研究センター年報, 9, 1–7 (March 2010).
[目次]
[56] “
Efficiency in the calculation of absorption corrections for cylinders
”,
T. Ida,
J. Appl. Cryst. 43(5), 1124–1125 (October 2010).
[reprint]
[57] “
Evaluation of crystallite size distribution by a capillary spinner-scan method in synchrotron
powder diffractometry
” (invited paper),
T. Ida, T. Goto & H. Hibino,
IOP Conf. Ser.: Mater. Sci. Eng. 18, 022002 (6 pages) (May 2011).
[doi: 10.1088/1757-899X/18/2/022002]
[58] “
Crystal structures of solid solution (Ba1−xCax)(Sc1/2Nb1/2)O3 system
”,
H. Nakano, T. Ida, M. Takemoto & H. Ikawa,
IOP Conf. Ser.: Mater. Sci. Eng. 18, 082023 (4 pages) (May 2011).
[doi: 10.1088/1757-899X/18/8/082023]
[59] “
Particle statistics in synchrotron powder diffractometry
”,
T. Ida, T. Goto & H. Hibino,
Z. Kristallogr. Proc. 1(5), 69–74 (September 2011).
[abstract]
[PDF (283 kB)]
[PDF with links (284 kB)]
[doi: 10.1524/zkpr.2011.0010]
[60] “
Particle statistics of a capillary specimen in synchrotron powder diffractometry
”,
T. Ida,
J. Appl. Cryst. 44(5), 911–920 (October 2011).
[reprint]
[doi: 10.1107/S002188981102824X]
[61] “
Application of a theory for particle statistics to structure refinement from powder diffraction data
”,
T. Ida & F. Izumi,
J. Appl. Cryst. 44(5), 921–927 (October 2011).
[reprint]
[doi: 10.1107/S0021889811031013 ]
[62] “ Effect of Preferred Orientation in Synchrotron X-ray Powder Diffraction ”,
T. Ida,
Annual Report of the Advanced Ceramics Research Center, Nagoya Institute of Technology 2, 7–11 (May 2013).
[reprint]
[index]
[63] “ Analytical method for observed powder diffraction intensity data based on maximum likelihood estimation ”,
T. Ida & F. Izumi,
Powder Diffr. 28(02), 124–126 (June 2013).
[doi: 10.1107/S0885715613000195]
[64] “ Powder x-ray structure refinement applying a theory for particle statistics ”
T. Ida,
Solid State Phenoma 203–204, 3–8 (Online since June 2013).
[preprint]
[doi: 10.4028/www.scientific.net/SSP.203-204.3]
[65] “ Improvement of the piezoelectric properties in (K, Na)NbO3-Based Lead-Free Piezoelectric Ceramic With Two-Phase Co-Existing State ”
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi, & T. Ida,
J. Appl. Phys. 117, 214102–6 (June 2015).
[doi: 10.1063/1.4921860]
[66] “ Experimental estimation of uncertainties in powder diffraction intensities with a two-dimensional X-ray detector ”
T. Ida,
Powder Diffr. 31, 216–222 (Sep. 2016).
[doi: 10.1017/S0085715616000324]
[67] “ ギ酸で安定化させたアルミナ前駆体水溶液の乾燥方法が α-Al2O3 への相転移と粒子形態に及ぼす影響 ”,
吉田 道之, 加藤 雄太, 櫻田 修, 尾畑 成造, 井田 隆, 田中 誠, 北岡 諭
粉体工学会誌, 53, 571–576 (Sep. 2016).
[目次]
[68] “ Crystal structure and phase transition behavior in (K1-xNax)NbO3-based lead-free piezoelectric ceramic over a wide range of temperatures ”
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi & T. Ida,
J. Appl. Phys. 120, 214102 (Dec. 2016).
[doi: 10.1063/1.4969044]
[69] “ Analysis of powder diffraction data collected with synchrotron x-ray and multiple 2D x-ray detectors applying a beta-distribution peak profile model ”
T. Ida, K. Wachi, D. Hattan, S. Ono, S. Tachiki, Y. Nakanishi, Y. Sakuma, A. Wada & S. Towata
Powder Diffr. 32(3), Supplement 1, 214102 (Sep. 2017).
[doi: 10.1017/S0885715617000781]
[70] “ Phase transition behavior of (K,Na)NbO3-based high-performance lead-free piezoelectric ceramic composite with different phase compositions depending on Na fraction ”
H. Yamada, T. Matsuoka, M. Yamazaki, K. Ohbayashi & T. Ida,
Jpn. J. Appl. Phys. 57, 011502 (Jan. 2018).
[doi: 10.7567/JJAP.57.011502]
[71] “Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura,
Powder Diffr. 33, 80–87 (Jun. 2018).
[doi: 10.1017/S0885715618000258]
[72] “Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura,
Powder Diffr. 33, 108–114 (Jun. 2018).
[doi: 10.1017/S0885715618000337]
[73] “Improvement of deconvolution–convolution treatment of axial-divergence aberration in Bragg–Brentano geometry”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura,
Powder Diffr. 33, 121–133 (Jun. 2018).
[doi: 10.1017/S0885715618000349]
[74] “ 粉末回折ピーク形状の Pearson VII 関数によるモデル化 ”,
井田 隆
名古屋工業大学 先進セラミックス研究センター年報 (2018), 7, 12–18 (July, 2019).
[Japanese]
[PDF]
[75] “Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method”
T. Ida
J. Appl. Cryst. 53(3), 679–685 (Jul. 2020).
[doi: 10.1107/S1600576720005130]
[76] “Application of deconvolutional treatment to powder diffraction datacollected with a Bragg-Brentano diffractometer with a contaminated Cu target and a Ni filter”
T. Ida
Powder Diffr. 35(3), 166–177 (Jul. 2020).
[doi: 10.1017/S0885715620000445]
[77] “ 一次元ストリップ型X線検出器の連続走査積算測定における赤道収差 ”,
井田 隆
名古屋工業大学 先進セラミックス研究センター年報, 8, 1–7 (July, 2020).
[Japanese]
[PDF]
[78] “Equatorial aberration for powder diffraction data collected by continuous scan of a silicon strip X-ray detector”
T. Ida
Powder Diffr. 36(3), 169–175 (Sep. 2021).
[doi: https://doi.org/10.1017/S0885715621000403]
[79] “Continuous series of symmetric peak profile functions determined by standard deviation and kurtosis”
T. Ida
Powder Diffr. 36(4), 222–232 (Dec. 2021).
[doi: https://doi.org/10.1017/S0885715621000567]
[80] “Convolution and deconvolutional treatment on sample transparency aberration in Bragg-Brentano geometry”
T. Ida
Powder Diffr. 37(1), 13–21 (Mar. 2022).
[doi: https://doi.org/10.1017/S0885715622000021]
[81] “Powder X-ray diffraction intensities of corundum calculated by conventional and density functional theory methods and extracted by deconvolutional treatment on experimental data”
T. Ida
Powder Diffr. 38(2), 81–89 (Jun. 2023).
[doi: https://doi.org/10.1017/S0885715623000131]
[1] 日本化学会編「実験化学講座第４版」第１２巻 物質の機能性，pp46–57， 丸善 (April 1993).
[2] 細川益男監修，ナノパーティクルテクノロジーハンドブック編集委員会編「ナノパーティクルテクノロジーハンドブック」，pp252–257， 日刊工業新聞社 (April 2006).
[3] M. Hosokawa, K. Nogi, M. Naito & T. Yokoyama ed., “Nanoparticle Technology Handbook”, pp270–274, Elsevier (November 2007).
[4] 中井泉・泉富士夫編「粉末X線解析の実際 第２版」, pp81–85, 朝倉書店 (July 2009).
[5] 辻幸一・藤原学・宗林由樹・南秀明編「機器分析ハンドブック３ 固体・表面分析編」，Ｘ線回折法，化学同人 (March 2021)
[1] “
基礎パラメータ法による粉末回折ピークのプロファイルフィッティング
”,
井田 隆,
名古屋工業大学セラミックス研究施設年報, 9, 1–7 (2000).
[2] “
装置関数との畳み込みによる粉末回折ピークのモデルプロファイル関数
”,
井田 隆，
理学電機ジャーナル 32(1), 24–33 (April 2001).
[3] “
Model peak profile functions for powder diffractometry as convolutions with instrumental functions
”,
T. Ida,
Rigaku J. 18(2), 47–56 (November 2001).
[4] “
粉末Ｘ線回折パターンからのＫα2線と装置収差の影響の除去
”,
井田 隆・虎谷秀穂,
名古屋工業大学セラミックス基盤工学研究センター年報 1, 23–29 (March 2002).
[目次]
[5] “
粉末Ｘ線回折による結晶粒径評価
”,
井田 隆, 虎谷秀穂,
粉体工学会誌 40(3), 177–184 (March 2003)
[6] “
粉末Ｘ線回折ピーク形状における有限な結晶粒サイズの効果
”,
井田 隆，
名古屋工業大学セラミックス基盤工学研究センター年報, 3, 23–35 (March 2004).
[目次]
[7] “
粉末回折法の使い方 (1) −装置の選び方と使い方−
”,
井田 隆,
J. Flux Growth, 3(1), 2–6 (June, 2008).
[preprint]
[8] “
回折ピーク形状分析による粒度分布評価
”,
井田 隆,
セラミックス 43(11), 917–921 (November, 2008).
[Japanese]
[preprint]
[9] “
粉末回折法の使い方(2) −測定試料の準備−
”,
井田 隆,
J. Flux Growth, 3(2), 50–55 (December, 2008).
[Japanese]
[preprint]
[10] “
粉末回折法の使い方(3) −回折計の調整と校正−
”,
井田 隆,
J. Flux Growth, 4(1), 2–6 (June, 2009).
[Japanese]
[11] “
粉末回折法の使い方(4) −測定条件の設定−
”,
井田 隆,
J. Flux Growth, 4(2), 41–47 (December, 2009).
[Japanese]
[12] “ 粉末回折法の使い方(5) −物質の同定と定性分析，データベースの利用− ”,
井田 隆,
J. Flux Growth, 5(2), 48–54 (December, 2010).
[Japanese]
[13] “ 粉末Ｘ線回折法による相組成分析と球形試料の吸収補正 ”,
井田 隆,
名古屋工業大学先進セラミックス研究センター年報, 1, 23–28 (March 2012).
[目次]
[PDF]
[14] “ Ｘ線粉末解析の最新技術−１ ”,
井田 隆,
耐火物, 65(8), 348–353 (August, 2013).
[Japanese]
[プレプリント]
[15] “ Ｘ線粉末回折の最新技術−２ ”,
井田 隆,
耐火物, 65(10), 470–475 (October, 2013).
[Japanese]
[プレプリント]
[16] “ Advanced methods for powder diffraction analysis – I ”,
T. Ida,
J. Tech. Assoc. Refractories, Jpn., 34(4), 232–236 (December, 2014).
[preprint]
[17] “ Advanced methods for powder diffraction analysis – II ”,
T. Ida,
J. Tech. Assoc. Refractories, Jpn., 34(4),
237–242 (December, 2014).
[preprint]
[18] “ 入門講座 分析化学における放射光の利用 粉末Ｘ線回折 ”,
井田 隆,
ぶんせき, 2015 年 2 月号, 52–57 (February, 2015).
[Japanese]
[ぶんせき]
[19] “ 構造解析におけるベイズ推定の応用 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報, 3, 11–16 (July, 2015).
[Japanese]
[PDF]
[20] “ ICDD の活動 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報, 4, 12–19 (July, 2016).
[Japanese]
[PDF]
[21] “ 粉末回折データに対する逆畳み込み・畳み込み処理の考え方 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報 (2015), 5, 37–43 (June, 2016).
[Japanese]
[PDF]
[22] “ 逆畳み込み・畳み込み処理における誤差伝番 ”,
井田 隆
名古屋工業大学 先進セラミックス研究センター年報 (2017), 6, 19–22 (July, 2018).
[Japanese]
[PDF]
[23] “ デスクトップ型粉末回折装置とPDF-4/Organicsデータベースを利用した有機化合物の分析 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報 (2021), 10, 25–30 (Jul., 2022).
[Japanese]
[PDF]
[24] “ Lotgering 因子 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報 (2022), 11, 44–47 (Jul., 2023).
[Japanese]
[PDF]
[1] “ Reflectance spectra of DCNQI salts ”,
H. Tajima, G. Ojima, T. Ida, H. Kuroda, A. Kobayashi, R. Kato, H. Kobayashi, A. Ugawa, and K. Yakushi,
“The Physics and Chemistry of Organic Superconductors”
(Springer-Verlag Berlin, Heidelberg), vol. 51, 49–53 (1990).
[2] “ Optical spectra of highly conducting phthalocyanine salts ”,
K. Yakushi, H. Yamakado, T. Ida, A. Ugawa, H. Masuda, and H. Kuroda,
“The Physics and Chemistry of Organic Superconductors”
(Springer-Verlag Berlin, Heidelberg), vol. 51, 54–57 (1990).
[3] “ Microwave conductivity of the phthalocyanine and dicyanoquinonediimine salts ”,
H. Yamakado, A. Ugawa, T. Ida, and K. Yakushi,
“The Physics and Chemistry of Organic Superconductors” (Springer-Verlag Berlin, Heidelberg), vol. 51, 311–314 (1990).
[4] “ Crystal structure determination of (H2pc)3PF6−xClx
by synchrotron powder diffractometry ”,
T. Ida, F. Sato, H. Okuno, H. Yamakado and H. Toraya,
Photon Factory Activity Report 2001 — Part B —, 19, 157 (September 2002).
[index]
[PDF]
[5] “ Deconvolution of synchrotron powder diffraction data ”,
T. Ida,
Photon Factory Activity Report 2002 — Part B —, 20, 208 (November 2003).
[index]
[PDF]
[6] “ Connection of powder diffraction intensity data measured with a multiple-detector system ”,
T. Ida & H. Hibino,
Photon Factory Activity Report 2003 — Part B —, 21, 157 (2004).
[index]
[PDF]
[7] “ Symmetrisation of synchrotron X-ray powder diffraction peak profiles ”,
T. Ida & H. Hibino,
Photon Factory Activity Report 2004 — Part B —, 22,261 (November, 2005).
[index]
[PDF]
[8] “ Correction of counting loss for X-ray detection system ”,
T. Ida, Y. Iwata & H. Hibino,
Photon Factory Activity Report 2005 — Part B —, 23, 252 (2006).
[index]
[PDF]
[9] “ Application of resonant X-ray diffraction for investigation of crystal and band structures of sulfide photocatalysts derived from ZnS with isovalent substitutions ”,
V. Petrykin, M. Kakihana, Y. Shimodaira, A. Kudo, H. Sawa, A. Nakao, and T. Ida,
Photon Factory Activity Report 2006 #24 Part B, 120 (2007).
[index]
[PDF]
[10] “ Determination of crystal structure of tetragonal PbFeO2F ”,
T. Katsumata, Y. Inaguma, T. Ida, and T. Turui,
Photon Factory Activity Report 2006 #24 Part B, 167 (2007).
[index]
[PDF]
[11] “ Statistics of measured Intensities affected by counting loss in detection systems ”,
T. Ida and H. Hibino,
Photon Factory Activity Report 2006 #24 Part B, 276 (2007).
[index]
[PDF]
[12] “ Statistical Properties of Observed X-ray Intensities Affected by Counting Loss ”,
T. Ida, A. Oya & H. Hibino,
Photon Factory Activity Report 2007 #25 Part B, 272 (2008).
[index]
[PDF]
[13] “Particle Statistics in Synchrotron Powder Diffractometry”,
T. Ida, T. Goto, A. Oya & H. Hibino,
Photon Factory Activity Report 2008 #26 Part B
, p. 244 (2009).
[index]
[PDF]
[14] “
Particle Statistics in Synchrotron Powder Diffractometry
”,
T. Ida, T. Goto, A. Oya & H. Hibino,
Photon Factory Activity Report 2009 #27 Part B, p. 271 (2010).
[index]
[PDF]
[15] “
Particle Statistics in Rotating-Specimen Powder Diffractometry
”,
T. Ida,
Photon Factory Activity Report 2011 #29 Part B, p. 401 (2012).
[index]
[PDF]
[16] “ Evaluation of Absorption Factor for Capillary Specimens in Powder Diffractometry ”,
T. Ida,
Photon Factory Activity Report 2012 #30 Part B, p. 365 (2013).
[index]
[PDF]
[17] “ Preferred Orientation Factor in Synchrotron Powder Diffractometry ”,
T. Ida, Y. Togo, H. Funahashi & H. Hibino,
Photon Factory Activity Report 2013 #31 Part B, p. 337 (2014).
[index]
[PDF]
[18] “ 粉末回折データ処理アプリケーション MDI-JADE 多言語化 ”,
井田 隆,
名古屋工業大学 先進セラミックス研究センター年報 (2020), 9, 34–41 (Jul., 2021).
[Japanese]
[PDF]