Publications

[ Japnese page is here. ]

Research Papers:

[1] “ Optical study of bis(propylenedithio)tetrathiafulvalenium (BPDT-TTF) salts ”,
K. Yakushi, H. Tajima, T. Ida, M. Tamura, H. Hayashi, H. Kuroda, and A. Kobayashi,
Synthetic Metals, 24, 301-309 (1988).

[2] “ Pressure dependence of the polarized reflectance spectrum of the solid charge-transfer complex, perylene-TCNQ: Estimation of microscopic parameters ”,
T. Ida, K. Yakushi, and H. Kuroda,
J. Chem. Phys. 91, 3450-3455 (1989).

[3] “ Polarized reflectance spectra of DCNQI salts ”,
K. Yakushi, A. Ugawa, G. Ojima, T. Ida, H. Tajima, H. Kuroda, A. Kobayashi, R. Kato, and H. Kobayashi,
Mol. Cryst. Liq. Cryst., 181, 217-231 (1990).

[4] “ High-pressure optical study of partially oxidized metallophthalocyanines and metallotetrabenzoporphyrins ”,
T. Ida, H. Yamakado, H. Masuda, K. Yakushi, D. Kanazawa, H. Tajima, and H. Kuroda,
Mol. Cryst. Liq. Cryst., 181, 243-252 (1990).

[5] “ Pressure dependence of the polarized reflectance spectrum of a solid charge-transfer complex, perylene-hexacyanobutadiene (HCBD) ”,
T. Ida, K. Yakushi, H. Kuroda, H. Yamochi, and G. Saito,
Chem. Phys., 156, 113-122 (1991).

[6] “ d-π Interaction in conducting phthalocyaninatocobalt hexafluoroarsenate, CoPc(AsF₆)_0.5 ”,
K. Yakushi, H. Yamakado, T. Ida, and A. Ugawa,
Solid State Commun., 78, 919-923 (1991).

[7] “ Polarized reflectance spectra of single crystals of the phthalocyanine radicals NiPc(AsF₆)_0.5, H₂Pc(AsF₆)_0.67, and LiPc ”,
K. Yakushi, T. Ida, A. Ugawa, H. Yamakado, H. Ishii, and H. Kuroda,
J. Phys. Chem., 95, 7636-7641 (1991).

[8] “ Structure of the charge-transfer complex of (DBTTF)(BTDA-TCNQ) ”,
K. Iwasaki, T. Ida, A. Kawamoto, A. Ugawa, Y. Yamashita, K. Yakushi, and T. Suzuki,
Acta Cryst. C 48, 1982-1984 (1992).

[9] “ Measurement of magnetic susceptibility of magnesium ultrafine particles ”,
T. Ida and K. Kimura,
Z. Phys. D 26, S140-142 (1993).

[10] “ Structure and solid state properties of the conductive salt of (phthalocyaninato) cobalt, CoPc(AsF₆)_0.5 ”,
K. Yakushi, H. Yamakado, T. Ida, A. Ugawa, K. Awaga, Y. Maruyama, K. Imaeda, and H. Inokuchi,
Synthetic Metals 55-57, 1699-1704 (1993).

[11] “ Structure and solid-state properties of the stable ring-oxidized conductor CoPc(AsF₆)_0.5: interaction between ring pi-electrons and cobalt d-electrons ”,
H. Yamakado, T. Ida, A. Ugawa, K. Yakushi, K. Awaga, Y. Maruyama, K. Imaeda, and H. Inokuchi,
Synthetic Metals 62, 169-178 (1994).

[12] “ Electrocrystallization, crystal structure, and solid state properties of halogen-bridged one-dimensional compound, {[Ni(en)₂Br](ClO₄)₂}_∞, having an elongated Ni…Ni distance ”,
Y. Ozawa, T. Ikuno, S. Amano, T. Ida, A. Ibaraki, K. Kimura, and K. Toriumi,
Mol. Cryst. Liq. Cryst. 278, 189-197 (1996).

[13] “ Blue-green photoluminescence from ultrafine colloidal Si particles in 2-propanol ”,
S. Iwasaki, T. Ida, and K. Kimura,
Jpn. J. Appl. Phys. 35, L551-L554 (1996).

[14] “ The preparation and properties of polycrystals of solid electrolyte ultrafine particles ”,
T. Ida, H. Saeki, H. Hamada, and K. Kimura,
Surface Rev. Lett. 3, 41-44 (1996).

[15] “ Plasmon absorption of gold nanoparticles and their morphologies observed by AFM ”,
H. Ishikawa, T. Ida, and K. Kimura,
Surface Rev. Lett. 3, 1153-1156 (1996).

[16] “ Temperature effect on gold nanodispersion in organic liquids ”,
Y. Takeuchi, T. Ida, and K. Kimura,
Surface Rev. Lett. 3, 1205-1208 (1996).

[17] “ Colloidal stability of gold nanoparticles in 2-propanol under laser irradiation ”,
Y. Takeuchi, T. Ida, and K. Kimura,
J. Phys. Chem. B 101, 1322-1327 (1997).

[18] “ A novel method for large-scale synthesis of AgI nanoparticles ”,
S. Chen, T. Ida, and K. Kimura,
Chem. Commun., 1997, 2301-2302.

[19] “ Ionic conductivity of small-grain polycrystals of silver iodide ”,
T. Ida and K. Kimura, Solid State Ionics, 107, 313-318 (1998).

[20] “ Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry ”,
T. Ida,
Rev. Sci. Instrum., 69, 2268-2272 (1998).
[reprint]

[21] “ Thiol-derivatized AgI Nanoparticles: Synthesis, Characterization and Optical Properties ”,
S. Chen, T. Ida, and K. Kimura,
J. Phys. Chem. B 102, 6169-6176 (1998).

[22] “ An efficient method for calculating asymmetric diffraction peak profiles ”,
T. Ida,
Rev. Sci. Instrum., 69, 3837-3839 (1998).
[reprint]

[23] “ Flat-Specimen Effect as a Convolution in Powder Diffractometry with Bragg-Brentano Geometry ”,
T. Ida and K. Kimura,
J. Appl. Cryst., 32, 634-640 (1999).

[24] “ Effect of Sample Transparency in Powder Diffractometry with Bragg-Brentano Geometry as a Convolution ”,
T. Ida and K. Kimura,
J. Appl. Cryst., 32, 982-991 (1999).

[25] “ Extended pseudo-Voigt function for approximating the Voigt profile ”, T. Ida, M. Ando and H. Toraya, J. Appl. Cryst., 33, 1311-1316 (2000).
[reprint]

[26] “ Peak profile function for synchrotron X-ray diffractometry ”,
T. Ida, H. Hibino and H. Toraya,
J. Appl. Cryst., 34, 144-151 (2001).
[reprint]

[27] “ Ab initio structure determination of monoclinic 2,2-dihydroxymethylbutanoic acid from synchrotron radiation powder diffraction data: combined use of direct methods and the Monte Carlo method ”,
Y. Tanahashi, H. Nakamura, S. Yamazaki, Y. Kojima, H. Saito, T. Ida and H. Toraya,
Acta Cryst. B 57, 184-189 (2001).

[28] “ The Monte Carlo method for finding missing atoms in solving crystal structures from powder diffraction data without applying a rigid-body approximation ”,
H. Nakamura, S. Yamazaki, T. Ohnishi, T. Ida, and H. Toraya,
Powder Diffraction, 16(2), 65-70 (June 2001).

[29] “ Development of Model Profile Functions for Powder X-Ray Diffractometry ”,
T. Ida,
J. Cryst. Soc. Jpn., 43(3), 269-274 (June 2001). [Japanese]

[30] “ Standardless Estimation of Lattice Constants Based on Fundamental Parameters Approach ”,
T. Ida and H. Toraya,
Materials Science Forum, 378/381, 86-91 (October 2001).

[31] “ Deconvolution of the instrumental functions in powder X-ray diffractometry ”,
T. Ida and H. Toraya,
J. Appl. Cryst., 35, 58-68 (February 2002). [reprint]

[32] “ Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry ”,
T. Ida, H. Hibino and H. Toraya,
J. Appl. Cryst., 36(2), 181-187 (April 2003)
[reprint]

[33] “ Quantitative basis for the rocking-curve measurement of preferred orientation in polycrystalline thin films ”,
H. Toraya, H. Hibino, T. Ida and N. Kuwano,
J. Appl. Cryst., 36(3), 890-897 (June 2003)

[34] “ Elimination of Instrumental Aberrations from Powder X-ray Diffraction Data by a Deconvolution Method ”,
T. Ida,
J. Cryst. Soc. of Jpn., 45(4), 249-255 (August 2003) [Japanese]

[35] “ Diffraction peak profiles from spherical crystallites with lognormal size distribution ”,
T. Ida, S. Shimazaki, H. Hibino and H. Toraya,
J. Appl. Cryst., 36(5), 1107-1115 (October 2003)
[reprint]

[36] “ Estimation of dielectric property for BaTiO₃ nano-particles by Raman scattering ”,
T. Ohno, D. Suzuki, H. Suzuki and T. Ida,
Journal of the Society of Powder Technology Japan, 41(2), 4-9 (February 2004). [Japanese]

[37] “ Ionization potentials of transparent conductive indium tin oxide films covered with a single layer of fluorine-doped tin oxide nanoparticles grown by spray pyrolysis deposition ”,
T. Fukano, T. Motohiro, T. Ida and H. Hashizume,
J. Appl. Phys., 97, 084316 (9pages) (April 2005).

[38] “ Correction for counting losses in X-ray diffractometry ”,
T. Ida and Y. Iwata,
J. Appl. Cryst., 38(3), 426-432 (June 2005).
[reprint]

[39] “ Connection of segmented intensity data measured with a multiple-detector system for powder diffractometry ”,
T. Ida,
J. Appl. Cryst. 38(5), 795-803 (October 2005).
[reprint]

[40] “ A compact furnace for synchrotron powder diffraction measurements up to 1807 K ”,
M. Yashima, M. Tanaka, K. Oh-uchi and T. Ida,
J. Appl. Cryst. 38(5), 854-855 (October 2005).
[reprint]

[41] “ A non-centrosymmetric polymorph of Gd₃RuO₇ ”,
N. Ishizawa, K. Hiraga, D. Boulay, H. Hibino, T. Ida and S. Oishi,
Acta Cryst. E 62, i13-i16 (January 2006).

[42] “ Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer ”,
T. Ida and H. Hibino,
J. Appl. Cryst. 39(1), 90-100 (February 2006).
[reprint]

[43] “ Development of Analytical Method for Diffraction Intensity Data Measured with a High-Resolution Synchrotron X-ray Powder Diffractometer with Multiple-Detector System ”,
T. Ida and H. Hibino,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology 5, 1-11 (April 2006). [Japanese]

[44] “ A Compact Furnace for Synchrotron Powder Diffraction Experiments up to 1800 K ”,
M. Yashima, K. Oh-uchi, M. Tanaka and T. Ida,
J. Am. Ceram. Soc. 89[4], 1395-1399 (April 2006).

[45] “ The effect of oxygen pressure on the synthesis of LiNiO₂ ”,
B-H. Kim, J-H. Kim, M-Y. Song, T. Ida and N. Ishizawa,
Solid State Phenomena, 124-126 1043-1046 (December 2006)

[46] “ New Parameters to Specify the Sharpness of Powder Diffraction Peak Profiles ”,
T. Ida,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology 6, 1-11 (April 2007). [Japanese] [index]

[47] “ Crystallite Size Distribution Analysis Using X-ray Diffraction Method – Analysis of Zinc Oxide Nano-crystals Synthesized from Bis(acetylacetonato)zinc – ”,
H. Konaka, A. Sasaki, K. Inaba, T. Ida, K. Haga and T. Shishido,
J. Flux Growth, 2(1), 41-44 (June 2007). [Japanese]

[48] “ Monte Carlo Simulation of the Effect of Counting Losses on Measured X-ray Intensities ”
T. Ida, J. Appl. Cryst., 40(5), 964-965 (October 2007).
[reprint]

[49] “ Advancement in Synchrotron Powder Diffractometry with Multiple-Detector System ”,
T. Ida,
J. Cryst. Soc. Jpn., 49(6), 347-353 (December 2007). [Japanese]

[50] “ Statistical Properties of Measured Intensity Affected by Counting Losses of Detection Systems ”,
T. Ida,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology 7, 1-5 (March 2008). [Japanese]

[51] “ New measures of sharpness for symmetric powder diffraction peak profiles ”,
T. Ida,
J. Appl. Cryst. 41(2), 393-401 (April 2008).
[reprint]

[52] “ Statistical properties of measured X-ray intensities affected by counting loss ”,
T. Ida,
J. Appl. Cryst. 41(6), 1019-1023 (December 2008).
[reprint]

[53] “ Isolation of Solid Solution Phases in Size-Controlled Li_xFePO₄ at Room Temperature ”
G. Kobayashi, S. Nishimura, M. Park, R. Kanno, M. Yashima, T. Ida & A. Yamada,
Adv. Funct. Mater. 41(6), 1019-1023 (February 2009).

[54] “ Evaluation of particle statistics in powder diffractometry by a spinner-scan method ”
T. Ida, T. Goto & H. Hibino,
J. Appl. Cryst. 42(4), 597-606 (August 2009).
[reprint]

[55] “ Effect of particle statistics in synchrotron powder diffractometry ”
T. Ida, T. Goto & H. Hibino,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology 9, 1-7 (March 2010). [Japanese]

[56] “ Efficiency in the calculation of absorption corrections for cylinders ” T. Ida,
J. Appl. Cryst. 43(5), 1124-1125 (October 2010).
[reprint]

[57] “ Evaluation of crystallite size distribution by a capillary spinner-scan method in synchrotron powder diffractometry ” (invited paper),
T. Ida, T. Goto & H. Hibino,
IOP Conf. Ser.: Mater. Sci. Eng. 18, 02202 (6 pages) (May 2011).
[doi:10.1088/1757-899X/18/2/022002]

[58] “ Crystal structures of solid solution (Ba_1-xCa_x)(Sc_1/2Nb_1/2)O₃ system ”,
H. Nakano, T. Ida, M. Takemoto & H. Ikawa,
IOP Conf. Ser.: Mater. Sci. Eng. 18, 082023 (4 pages) (May 2011).
[doi: 10.1088/1757-899X/18/8/082023]

[59] “ Particle statistics in synchrotron powder diffractometry ”,
T. Ida, T. Goto & H. Hibino,
Z. Kristallogr. Proc. 1(5), 69--74 (September 2011).
[abstract] [PDF (283 kB)] [PDF with links (284 kB)] [doi: 10.1524/zkpr.2011.0010]

[60] “ Particle statistics of a capillary specimen in synchrotron powder diffractometry ”,
T. Ida,
J. Appl. Cryst. 44(5), 911--920 (October 2011).
[reprint] [doi: 10.1107/S002188981102824X]

[61] “ Application of a theory for particle statistics to structure refinement from powder diffraction data ”,
T. Ida & F. Izumi,
J. Appl. Cryst. 44(5), 921--927 (October 2011).
[reprint] [doi: 10.1107/S0021889811031013 ]

[62] “ Effect of Preferred Orientation in Synchrotron X-ray Powder Diffraction ”,
T. Ida,
Annual Report of the Advanced Ceramics Research Center, Nagoya Institute of Technology 2, 7–11 (May 2013).
[reprint] [index]

[63] “ Analytical method for observed powder diffraction intensity data based on maximum likelihood estimation ”,
T. Ida & F. Izumi,
Powder Diffr. 28(02), 124–126 (June 2013).
[doi: 10.1107/S0885715613000195]

[64] “ Powder x-ray structure refinement applying a theory for partile statistics ”
T. Ida,
Solid State Phenoma 203–204, 3–8 (Online since June 2013).
[preprint] [doi: 10.4028/www.scientific.net/SSP.203-204.3]

[65] “ Improvement of the piezoelectric properties in (K, Na)NbO₃-Based Lead-Free Piezoelectric Ceramic With Two-Phase Co-Existing State ”
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi, & T. Ida,
J. Appl. Phys. 117, 214102–6 (June 2015).
[doi: 10.1063/1.4921860]

[66] “ Experimental estimation of uncertainties in powder diffraction intensities with a two-dimensional X-ray detector ”
T. Ida,
Powder Diffr. 31, 216–222 (Sep. 2016).
[doi: 10.1017/S0085715616000324]

[67] “ Effects of drying method of aqueous alumina precursor stabilized by formic acid on phase transition to α-Al₂O₃ and particle morphology, ”
M. Yoshida, Y. Kato, O. Sakurada, S. Obata, T. Ida, M. Tanaka and S. Kitaokia
J. Soc. Powder Tech. Jpn., 53, 571–576 (Sep. 2016). [Japanese]

[68] “ Crystal structure and phase transition behavior in (K_1-xNa_x)NbO₃-based lead-free piezoelectric ceramic over a wide range of temperatures ”
H. Yamada, T. Matsuoka, H. Kozuka, M. Yamazaki, K. Ohbayashi & T. Ida,
J. Appl. Phys. 120, 214102 (Dec. 2016).
[doi: 10.1063/1.4969044]

[69] “ Analysis of powder diffraction data collected with synchrotron x-ray and multiple 2D x-ray detectors applying a beta-distribution peak profile model ”
T. Ida, K. Wachi, D. Hattan, S. Ono, S. Tachiki, Y. Nakanishi, Y. Sakuma, A. Wada & S. Towata
Powder Diffr. 32(3), Supplement 1, 214102 (Sep. 2017).
[doi: 10.1017/S0885715617000781]

[70] “ Phase transition behavior of (K,Na)NbO₃-based high-performance lead-free piezoelectric ceramic composite with different phase compositions depending on Na fraction ”
H. Yamada, T. Matsuoka, M. Yamazaki, K. Ohbayashi & T. Ida, Jpn. J. Appl. Phys. 57, 011502 (Jan. 2018).
[doi: 10.7567/JJAP.57.011502]

[71] “Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura, Powder Diffr. 33, 80–87 (Jun. 2018).
[doi: 10.1017/S0885715618000258]

[72] “Removal of small parasite peaks in powder diffraction data by a multiple deconvolution method”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura, Powder Diffr. 33, 108–114 (Jun. 2018).
[doi: 10.1017/S0885715618000337]

[73] “Improvement of deconvolution–convolution treatment of axial-divergence aberration in Bragg–Brentano geometry”
T. Ida, S. Ono, D. Hattan, T. Yoshida, Y. Takatsu & K. Nomura, Powder Diffr. 33, 121–133 (Jun. 2018).
[doi: 10.1017/S0885715618000349]

Book:

[1] Jikken Kagaku Koza, 4th ed., volume 12, Busshitsu no Kino-sei, edited by the Chemical Society of Japan, Maruzen, pp46-57 (April 1993). [Japanese]

[2] Nanoparticle Technology Handbook, edited by editorial committee of nanoparticle technology handbook, Nikkan Kogyo Shinbun, pp252-257 (April 2006). [Japanese]

[3] Nanoparticle Technology Handbook, edited by M. Hosokawa, K. Nogi, M. Naito & T. Yokoyama, Elsevier, pp270-274 (November 2007).

[4] Fummatsu X Sen Kaiseki no Jissai 2nd ed., edited by I. Nakai & F. Izumi, Asakura Shoten, pp81-85 (July 2009). [Japanese]

Review articles:

[1] “Fundamental-parameters approach to profile fitting of powder diffraction peaks”,
T. Ida,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology, 9, 1-7 (1999). [Japanese]

[2] “Model peak profile functions for powder diffractometry as convolutions with instrumental functions”,
T. Ida,
Rigaku-Denki J. 32(1), 24-33 (April 2001). [Japanese]

[3] “Model peak profile functions for powder diffractometry as convolutions with instrumental functions”,
T. Ida,
Rigaku J. 18(2), 47-56 (November 2001).

[4] “Elimination of K alpha₂ lines and effects of instrumental aberrations from powder X-ray diffraction pattern”,
T. Ida and H. Toraya,
Annual Report of the Ceramics Research Laboratory Nagoya Institute of Technology, 11, 23-29 (March 2002). [Japanese]

[5] “Estimation of crystallite size by powder X-ray diffractometry”,
T. Ida and H. Toraya,
J. Soc. Powder Technol., Japan, 40(3), 177-184 (March 2003). [Japanese]

[6] “Effects of finite crystallite size on powder diffraction peak profiles”,
T. Ida,
Annual Report of the Ceramics Research Laboratory, Nagoya Institute of Technology, 13, 23-35 (March 2004). [Japanese]

[7] “How to Use Powder Diffraction Method (1) — Selection and Use of a Powder Diffractometer —”,
T, Ida,
J. Flux Growth, 3(1), 2-6 (June, 2008). [Japanese]
[preprint]

[8] “ Evaluation of Crystallite Size Distribution by Diffraction Peak Profile Analysis”
T, Ida,
Bull. Ceram. Soc. Jpn., 43(11), 917-921 (November, 2008). [Japanese]
[preprint]

[9] “How to Use Powder Diffraction Method (2) — Preparation of Specimen —”,
T, Ida,
J. Flux Growth, 3(2), 50-55 (December, 2008). [Japanese]
[preprint]

[10] “How to Use Powder Diffraction Method (3) — Adjustment and Calibration of Diffractometer —”,
T. Ida,
J. Flux Growth, 4(1), 2-6 (June, 2009). [Japanese]
[preprint]

[11] “How to Use Powder Diffraction Method (4) — Settings of Measurement —”
T. Ida,
J. Flux Growth, 4(2), 41-47 (December, 2009). [Japanese]
[preprint]

[12] “How to Use Powder Diffraction Method (5) — Identification and Qualitative Analysis, Application of Database —”
T. Ida,
J. Flux Growth, 5(2), 48-54 (December, 2010). [Japanese]
[preprint]

[13] “Quantitative Phase Analysis by Powder X-ray Diffraction Method and Absorption Correction of Sphere”
T. Ida,
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology, 1, 23-28 (March 2013).
[ PDF ] [Japanese]

[14] “Advanced methods for powder diffraction analysis – I –”,
T, Ida,
Taikabutsu, 65(8), 348–353 (August, 2013). [Japanese]
[preprint]

[14] “Advanced methods for powder diffraction analysis – II –”,
T, Ida,
Taikabutsu, 65(10), 470–475 (October, 2013). [Japanese]
[preprint]

[16] “ Advanced methods for powder diffraction analysis – I ”,
T. Ida,
J. Tech. Assoc. Refractories, Jpn., 34(4), 232–236 (December, 2014).
[preprint]

[17] “ Advanced methods for powder diffraction analysis – II ”,
T. Ida,
J. Tech. Assoc. Refractories, Jpn., 34(4), 237–242 (December, 2014).
[preprint]

[18] “Application of synchrotron radiation to powder X-ray diffraction”,
Takashi Ida,
Bunseki, 2015 (2), 52–57 (February, 2015). [Japanese]
[ぶんせき]

[19] “Application of Bayesian Inference to Structure Analysis”,
Takashi Ida,
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology, 3, 11–16 (July, 2015). [Japanese]
[PDF]

[20] “Activities of ICDD”,
Takashi Ida,
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology, 4, 12–19 (July, 2016). [Japanese]
[PDF]

[21] “Concept of Deconvolution-Convolution Treatment on Powder X-ray Diffraction Data”,
Takashi Ida,
Annual Report of Advanced Ceramics Research Center, Nagoya Institute of Technology, 5, 37–43 (June, 2016). [Japanese]
[PDF]

Reports and Other articles:

[1] “Reflectance spectra of DCNQI salts”,
H. Tajima, G. Ojima, T. Ida, H. Kuroda, A. Kobayashi, R. Kato, H. Kobayashi, A. Ugawa, and K. Yakushi,
“The Physics and Chemistry of Organic Superconductors” (Springer-Verlag Berlin, Heidelberg), vol. 51, 49-53 (1990).

[2] “Optical spectra of highly conducting phthalocyanine salts”,
K. Yakushi, H. Yamakado, T. Ida, A. Ugawa, H. Masuda, and H. Kuroda,
“The Physics and Chemistry of Organic Superconductors” (Springer-Verlag Berlin, Heidelberg), vol. 51, 54-57 (1990).

[3] “Microwave conductivity of the phthalocyanine and dicyanoquinonediimine salts”,
H. Yamakado, A. Ugawa, T. Ida, and K. Yakushi,
“The Physics and Chemistry of Organic Superconductors” (Springer-Verlag Berlin, Heidelberg), vol. 51, 311-314 (1990).

[4] “Crystal structure determination of (H₂pc)₃PF_6-xCl_x by synchrotron powder diffractometry”,
T. Ida, F. Sato, H. Okuno, H. Yamakado and H. Toraya,
Photon Factory Activity Report 2001 - Part B -, 19, 157 (September 2002).

[5] “Deconvolution of synchrotron powder diffraction data”,
T. Ida,
Photon Factory Activity Report 2002 - Part B -, 20 208 (November 2003).

[6] “Connection of powder diffraction intensity data measured with a multiple-detector system”,
T. Ida & H. Hibino,
Photon Factory Activity Report 2003 - Part B -, 21, 157 (2004).

[7] “Symmetrisation of synchrotron X-ray powder diffraction peak profiles”,
T. Ida & H. Hibino,
Photon Factory Activity Report 2004 - Part B -, 22, 261 (2005).

[8] “Correction of counting loss for X-ray detection system”,
T. Ida, Y. Iwata & H. Hibino,
Photon Factory Activity Report 2005 - Part B -, 23, 252 (2006).

[9] “Application of resonant X-ray diffraction for investigation of crystal and band structures of sulfide photocatalysts derived from ZnS with isovalent substitutions”,
V. Petrykin, M. Kakihana, Y. Shimodaira, A. Kudo, H. Sawa, A. Nakao, and T. Ida,
Photon Factory Activity Report 2006 #24 Part B, 120 (2007).
[PDF]

[10] “Determination of crystal structure of tetragonal PbFeO₂F ”,
T. Katsumata, Y. Inaguma, T. Ida, and T. Turui,
Photon Factory Activity Report 2006 #24 Part B, 167 (2007).
[PDF]

[11] “Statistics of measured Intensities affected by counting loss in detection systems”,
T. Ida and H. Hibino,
Photon Factory Activity Report 2006 #24 Part B, 276 (2007).
[PDF]

[12] “Statistical Properties of Observed X-ray Intensities Affected by Counting Loss”,
T. Ida, A. Oya & H. Hibino,
Photon Factory Activity Report 2007 #25 Part B, 272 (2008).
[index] [PDF]

[13] “Particle Statistics in Synchrotron Powder Diffractometry”,
T. Ida, T. Goto, A. Oya & H. Hibino,
Photon Factory Activity Report 2008 #26 Part B (2009) p. 244.

[14] “Particle Statistics in Synchrotron Powder Diffractometry”,
T. Ida, T. Goto, A. Oya & H. Hibino,
Photon Factory Activity Report 2009 #27 Part B (2010) p. 271.

[15] “Particle Statistics in Rotating-Specimen Powder Diffractometry”,
T. Ida,
Photon Factory Activity Report 2011 #29 Part B, p. 401 (2012).
[index] [PDF]

[16] “Evaluation of Absorption Factor for Capillary Specimens in Powder Diffractometry”,
T. Ida,
Photon Factory Activity Report 2012 #30 Part B, p. 365 (2013).
[index] [PDF]

[17] “Preferred Orientation Factor in Synchrotron Powder Diffractometry”,
T. Ida, Y. Togo, H. Funahashi & H. Hibino,
Photon Factory Activity Report 2013 #31 Part B, p. 337 (2014).
[index] [PDF]

Updated Jul. 5, 2018