Takashi IDA / Research / Reprints

[ Japanese Page is HERE. ]

Reprints available in PDF formats.

1. “ Application of a theory for particle statistics to structure refinement from powder diffraction data ”
   [PDF (1.1 MB)]
   T. Ida & F. Izumi
   J. Appl. Cryst. 44(5), 921--927 (October 2011).
   [doi:10.1107/S0021889811031013]
2. “ Particle statistics of a capillary specimen in synchrotron powder diffractometry ”
   [PDF (418 kB)]
   T. Ida
   J. Appl. Cryst. 44(5), 911--920 (October 2011).
   [doi:10.1107/S002188981102824X]
3. “ Efficiency in the calculation of absorption corrections for cylinders ”
   [PDF (102 kB)]
   T. Ida
   J. Appl. Cryst. 43(5), 1124--1125 (October 2010).
   Link to Applied Crystallography Online : Journal of Applied Crystallography, 2010, Volume 43, pages 1124-1125
4. “ Evaluation of particle statistics in powder diffractometry by a spinner-scan method ”
   [PDF (772 kB)]
   T. Ida, T. Goto & H. Hibino
   J. Appl. Cryst. 42(4), 597---606 (August 2009).
   Copyright © International Union of Crystallography
   
5. “ Statistical properties of measured X-ray intensities affected by counting loss ”
   [PDF (187 kB)]
   T. Ida
   J. Appl. Cryst. 41(6), 1019---1023 (December 2008).
   Copyright © International Union of Crystallography
   
6. “ New measures of sharpness for symmetric powder diffraction peak profiles ”
   [PDF (328 kB)]
   T. Ida
   J. Appl. Cryst. 41(2), 393---401 (April 2008).
   Copyright © International Union of Crystallography
   
7. “ Monte Carlo simulation of the effect of counting losses on measured x-ray intensities ”
   [PDF (148 kB)]
   T. Ida
   J. Appl. Cryst. 40(5), 964--965 (October 2007).
   Copyright © International Union of Crystallography
   
8. “ Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer ”
   [PDF (240 kB)]
   T. Ida & H. Hibino
   J. Appl. Cryst. 39(1), 90---100 (February 2006).
   Copyright © International Union of Crystallography
   
9. “ A compact furnace for synchrotron powder diffraction measurements up to 1807 K ”
   [(PDF 152 kB)]
   M. Yashima, M. Tanaka, K. Oh-uchi & T. Ida
   J. Appl. Cryst. 38(5), 854---855 (October 2005).
   Copyright © International Union of Crystallography
   
10. “ Connection of segmented intensity data measured with a multiple-detector system for powder diffractometry ”
    [(PDF 660 kB)]
    T. Ida
    J. Appl. Cryst. 38(5), 795---803 (October 2005).
    Copyright © International Union of Crystallography
    
11. “ Correction for counting losses in X-ray diffractometry ”
    [PDF (400 kB)]
    T. Ida & H. Iwata
    J. Appl. Cryst. 38(3), 426---432 (June 2005).
    Copyright © International Union of Crystallography
    
12. “ Diffraction peak profiles from spherical crystallites with lognormal size distribution ”
    [PDF (440 kB)]
    T. Ida, S. Shimazaki, H. Hibino & H. Toraya
    J. Appl. Cryst. 36(5), 1107--1115 (Oct. 2003).
    Copyright © International Union of Crystallography
    
13. “ Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry ”
    [PDF (300 kB)]
    T. Ida, H. Hibino & H. Toraya
    J. Appl. Cryst. 36(2), 181--187 (Apr. 2003).
    Copyright © International Union of Crystallography
    
14. “ Deconvolution of the instrumental functions in powder X-ray diffractometry ”
    [PDF (396 kB)]
    T. Ida & H. Toraya
    J. Appl. Cryst. 35(1), 58--68 (Feb. 2002).
    Copyright © International Union of Crystallography
    
15. “ Peak profile function for synchrotron X-ray diffractometry ”
    [PDF (503 kB)]
    T. Ida, H. Hibino & H. Toraya
    J. Appl. Cryst. 34(1), 144--151 (Feb. 2001).
    Copyright © International Union of Crystallography
    
16. “ Extended pseudo-Voigt function for approximating the Voigt profile ”
    [PDF (312 kB)]
    T. Ida, M. Ando & H. Toraya
    J. Appl. Cryst. 33(6), 1311--1316 (Dec. 2000).
    Copyright © International Union of Crystallography
    
17. “ An efficient method for calculating asymmetric diffraction peak profiles ”
    [PDF (108 kB)]
    T. Ida, Rev. Sci. Instrum. 69(11), 3837--3839 (November 1998).
    Copyright © American Institute of Physics
    
18. " Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry ",
    [PDF (112 kB)] (Please apply following correction)
    [PDF correction (48 kB)]
    T. Ida, Rev. Sci. Instrum. 69(6), 2268--2272 (June 1998).
    Copyright © American Institute of Physics
    

Updated 29 September, 2011