introduction

Introduction of recent research topics

Development of new analytical method for powder structure refinement

A brand-new method for structure analysis from powder diffraction data, definitely different from the Rietveld method, has been developed.
[-> Brief introduction of the new method]

Particle statistics in powder diffractometry

Particle statistical error in powder difffraction measurements are investigated both theoretically and experimentally.

T. Ida, T. Goto & H. Hibino,
“ Evaluation of particle statistics in powder diffractometry by a spinner-scan method ”,
J. Appl. Cryst. 42(4), 597-606 (2009).
(-> download)

Correction of counting loss in counting method

Observed count of x-ray photons is underestimated because of counting loss of the detecting system. A precise and practical method to correct the counting loss has been developed.

T. Ida,
“ Statistical properties of measured X-ray intensities affected by counting loss ”,
J. Appl. Cryst. 41(6), 1019-1023 (December 2008).
(-> download)

T. Ida,
“ Monte Carlo simulation of the effect of counting losses on measured x-ray intensities ”,
J. Appl. Cryst. 40(5), 964-965 (October 2007).
(-> download)

T. Ida & H. Iwata,
“ Correction for counting losses in X-ray diffractometry ”,
J. Appl. Cryst. 38(3), 426-432 (June 2005).
(-> download)

Diffraction peak profile from log-normally size-distributed crystallites

T. Ida, S. Shimazaki, H. Hibino & H. Toraya,
“ Diffraction peak profiles from spherical crystallites with lognormal size distribution ”,
J. Appl. Cryst. 36(5), 1107-1115 (October 2003).
(-> download)

Whole powder pattern deconvolution method

T. Ida & H. Hibino,
“ Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer ”,
J. Appl. Cryst. 39(1), 90-100 (February 2006).
(-> download)

T. Ida, H. Hibino & H. Toraya,
“ Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry ”,
J. Appl. Cryst. 36(2), 181-187 (April 2003).
(-> download)

T. Ida & H. Toraya,
“ Deconvolution of the instrumental functions in powder X-ray diffractometry ”,
J. Appl. Cryst. 35(1), 58-68 (February 2002).
(-> download)

Efficient algorithm to evaluate convolution

T. Ida & K. Kimura,
“ Effect of sample transparency in powder diffractometry with Bragg-Brentano geometry as a convolution ”
J. Appl. Cryst., 32, 982-991 (1999).

T. Ida,
“ An efficient method for calculating asymmetric diffraction peak profiles ”
Rev. Sci. Instrum., 69, 3837-3839 (1998).

Instrumental functions of powder diffractometers

T. Ida, H. Hibino & H. Toraya,
“ Peak profile function for synchrotron X-ray diffractometry ”
J. Appl. Cryst., 34, 144-151 (2001).
(-> download)

T. Ida & K. Kimura,
“ Effect of sample transparency in powder diffractometry with Bragg-Brentano geometry as a convolution ”
J. Appl. Cryst., 32, 982-991 (1999).

T. Ida & K. Kimura,
“ Flat-specimen effect as a convolution in powder diffractometry with Bragg-Brentano geometry ”
J. Appl. Cryst., 32, 634-640 (1999).

T. Ida,
“ Formula for the asymmetric diffraction peak profiles based on double Soller slit geometry ”
Rev. Sci. Instrum., 69, 2268-2272 (1998).

August 18, 2011